Abstract:
The expressions for the spontaneous polar contribution δnSi to the principal values of the refractive index due to the quadratic electro-optic effect in ferroelectrics have been considered within the phenomenological approach taking into account the polarization fluctuations. A method has been proposed for calculating the magnitude and temperature dependence of the root-mean-square fluctuations of the polarization (short-range local polar order) Psh=⟨P2fl⟩1/2 below the ferroelectric transition temperature Tc from temperature changes in the spontaneous polar contribution δnSi(T) if the average spontaneous polarization Ps=⟨P⟩ characterizing the long-range order is determined from independent measurements (for example, from dielectric hysteresis loops). For the case of isotropic fluctuations, the proposed method has made it possible to calculate Psh and Ps only from refractometric measurements. It has been shown that, upon interferometric measurements, the method developed in this work allows calculating Psh and Ps directly from the measured temperature and electric-field changes in the relative optical path (the specific optical retardation) of the light.
Citation:
P. A. Markovin, V. A. Trepakov, A. K. Tagantsev, A. Deineka, D. A. Andreev, “Contribution of spontaneous polarization and its fluctuations to refraction of light in ferroelectrics”, Fizika Tverdogo Tela, 58:1 (2016), 131–135; Phys. Solid State, 58:1 (2016), 134–139