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This article is cited in 3 scientific papers (total in 3 papers)
Synthesis of easily testable circuits in the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements
Yu. V. Borodina
Abstract:
We suggest a method to synthesise easily testable circuits of functional elements
over the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ which realise Boolean functions
such that at most $h$ variables occur both with and without negation
in their disjunctive normal forms.
Constant faults of type $1$ at outputs of elements are allowed.
It is proved that a complete test for such circuits is of length at most $h$.
This research was supported by the Russian Foundation for Basic Research, grant
02–01–00985; by the program of the President of Russian Federation for supporting
leading scientific schools, grant 1087.2003.1; by the program ‘Universities of
Russia;’ and by the program of basic research of the Department of Mathematical
Sciences ‘Algebraic and Combinatoric Methods of Mathematical Cybernetics.’
Received: 30.03.2004
Citation:
Yu. V. Borodina, “Synthesis of easily testable circuits in the basis $\{\&,\vee,\bar{\vphantom{x}}\,\}$ under single-type constant faults at the outputs of elements”, Diskr. Mat., 17:1 (2005), 129–140; Discrete Math. Appl., 15:1 (2005), 63–74
Linking options:
https://www.mathnet.ru/eng/dm92https://doi.org/10.4213/dm92 https://www.mathnet.ru/eng/dm/v17/i1/p129
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