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Diskretnaya Matematika, 2023, Volume 35, Issue 4, Pages 69–78
DOI: https://doi.org/10.4213/dm1790
(Mi dm1790)
 

Short tests for contact circuits under one-type weakly connected faults of contacts

K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
References:
Abstract: We prove that for any natural $k$ any Boolean function can be implemented by a two-pole contact circuit that is $k$-irredundant and allows a $k$-diagnostic test of length no more than $1$ relative to one-type connected faults of contacts in groups where each group consists of one closing and one opening contact.
Keywords: contact circuit, connected faults of contacts, fault detection test, diagnostic test, Boolean function.
Received: 20.08.2023
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: K. A. Popkov, “Short tests for contact circuits under one-type weakly connected faults of contacts”, Diskr. Mat., 35:4 (2023), 69–78
Citation in format AMSBIB
\Bibitem{Pop23}
\by K.~A.~Popkov
\paper Short tests for contact circuits under one-type weakly connected faults of contacts
\jour Diskr. Mat.
\yr 2023
\vol 35
\issue 4
\pages 69--78
\mathnet{http://mi.mathnet.ru/dm1790}
\crossref{https://doi.org/10.4213/dm1790}
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  • https://www.mathnet.ru/eng/dm1790
  • https://doi.org/10.4213/dm1790
  • https://www.mathnet.ru/eng/dm/v35/i4/p69
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