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Short conditional complete diagnostic tests for circuits under one-type constant faults of gates
K. A. Popkov Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
Abstract:
We prove that any (almost any) $n$-place Boolean function can be implemented by a logic circuit in the “conjunction, disjunction, implication, negation” basis admitting a conditional complete diagnostic test of length at most $n$ (at most $n-1$, respectively) relative to constant faults of type $0$ on outputs of gates.
Keywords:
logic circuit, conditional test, complete diagnostic test, constant fault, Boolean function.
Received: 01.06.2022
Citation:
K. A. Popkov, “Short conditional complete diagnostic tests for circuits under one-type constant faults of gates”, Diskr. Mat., 34:3 (2022), 63–69; Discrete Math. Appl., 33:6 (2023), 381–386
Linking options:
https://www.mathnet.ru/eng/dm1727https://doi.org/10.4213/dm1727 https://www.mathnet.ru/eng/dm/v34/i3/p63
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Abstract page: | 177 | Full-text PDF : | 21 | References: | 38 | First page: | 10 |
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