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Diskretnaya Matematika, 2021, Volume 33, Issue 4, Pages 3–10
DOI: https://doi.org/10.4213/dm1660 (Mi dm1660) 		 
This article is cited in 2 scientific papers (total in 2 papers)

Some classes of easily testable circuits in the Zhegalkin basis

Yu. V. Borodina

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences
Full-text PDF (429 kB) Citations (2)
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DOI: https://doi.org/10.4213/dm1660
Abstract: We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained.
Keywords: circuit of gates, constant faults, fault detection test, Zhegalkin basis.
Received: 17.08.2021
English version:
Discrete Mathematics and Applications, 2023, Volume 33, Issue 1, Pages 1–6
DOI: https://doi.org/10.1515/dma-2023-0001
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: Yu. V. Borodina, “Some classes of easily testable circuits in the Zhegalkin basis”, Diskr. Mat., 33:4 (2021), 3–10; Discrete Math. Appl., 33:1 (2023), 1–6
Citation in format AMSBIB
\Bibitem{Bor21}
\by Yu.~V.~Borodina
\paper Some classes of easily testable circuits in the Zhegalkin basis
\jour Diskr. Mat.
\yr 2021
\vol 33
\issue 4
\pages 3--10
\mathnet{http://mi.mathnet.ru/dm1660}
\crossref{https://doi.org/10.4213/dm1660}
\transl
\jour Discrete Math. Appl.
\yr 2023
\vol 33
\issue 1
\pages 1--6
\crossref{https://doi.org/10.1515/dma-2023-0001}
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    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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    		Дискретная математика
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