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This article is cited in 2 scientific papers (total in 2 papers)
Some classes of easily testable circuits in the Zhegalkin basis
Yu. V. Borodina Keldysh Institute of Applied Mathematics of Russian Academy of Sciences
Abstract:
We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained.
Keywords:
circuit of gates, constant faults, fault detection test, Zhegalkin basis.
Received: 17.08.2021
Citation:
Yu. V. Borodina, “Some classes of easily testable circuits in the Zhegalkin basis”, Diskr. Mat., 33:4 (2021), 3–10; Discrete Math. Appl., 33:1 (2023), 1–6
Linking options:
https://www.mathnet.ru/eng/dm1660https://doi.org/10.4213/dm1660 https://www.mathnet.ru/eng/dm/v33/i4/p3
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Abstract page: | 226 | Full-text PDF : | 52 | References: | 23 | First page: | 15 |
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