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Diskretnaya Matematika, 2021, Volume 33, Issue 1, Pages 20–30
DOI: https://doi.org/10.4213/dm1629 (Mi dm1629) 		 
This article is cited in 4 scientific papers (total in 4 papers)

Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases

I. G. Lyubich, D. S. Romanov

Lomonosov Moscow State University
Full-text PDF (567 kB) Citations (4)
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DOI: https://doi.org/10.4213/dm1629
Abstract: We prove that an arbitrary Boolean function may be implemented by an irredundant Boolean circuit over an arbitrary finite complete basis so that the circuit admits a single diagnostic test of length at most 4 with respect to inversion faults at gate outputs.
Keywords: Boolean circuit, single diagnostic test, inversion fault at gate output, Shannon function, easily testable circuit.
Funding agency Grant number
Lomonosov Moscow State University 5.4.19
Received: 21.01.2021
English version:
Discrete Mathematics and Applications, 2022, Volume 32, Issue 1, Pages 1–9
DOI: https://doi.org/10.1515/dma-2022-0001
Bibliographic databases:
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: I. G. Lyubich, D. S. Romanov, “Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases”, Diskr. Mat., 33:1 (2021), 20–30; Discrete Math. Appl., 32:1 (2022), 1–9
Citation in format AMSBIB
\Bibitem{LyuRom21}
\by I.~G.~Lyubich, D.~S.~Romanov
\paper Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
\jour Diskr. Mat.
\yr 2021
\vol 33
\issue 1
\pages 20--30
\mathnet{http://mi.mathnet.ru/dm1629}
\crossref{https://doi.org/10.4213/dm1629}
\mathscinet{http://mathscinet.ams.org/mathscinet-getitem?mr=3900054}
\transl
\jour Discrete Math. Appl.
\yr 2022
\vol 32
\issue 1
\pages 1--9
\crossref{https://doi.org/10.1515/dma-2022-0001}
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  • https://doi.org/10.4213/dm1629
  • https://www.mathnet.ru/eng/dm/v33/i1/p20
    • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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