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This article is cited in 4 scientific papers (total in 4 papers)
Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
Yu. V. Borodinaab a Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
b Bauman Moscow State Technical University
Abstract:
We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length $1$ in case of constant faults of type “1” at gate outputs.
Keywords:
Boolean circuits, constant faults, fault detection tests, Zhegalkin basis.
Received: 26.12.2018
Citation:
Yu. V. Borodina, “Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs”, Diskr. Mat., 31:2 (2019), 14–19; Discrete Math. Appl., 30:5 (2020), 303–306
Linking options:
https://www.mathnet.ru/eng/dm1557https://doi.org/10.4213/dm1557 https://www.mathnet.ru/eng/dm/v31/i2/p14
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Abstract page: | 328 | Full-text PDF : | 32 | References: | 32 | First page: | 15 |
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