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On reliability of circuits over the bases $\{\sim,\&,\oplus\}$, $\{\sim,\&,0\}$, $\{\oplus,\&,1\}$, $\{\oplus,\vee,1\}$ in the case of faults of type 0 at the outputs of elements
M. A. Alekhina
Abstract:
In the case of faults of type 0 at the outputs of elements, it is proved that in the bases $\{\sim,\&,\oplus\}$, $\{\sim,\&,0\}$, $\{\oplus,\&,1\}$, $\{\oplus,\vee,1\}$ almost all Boolean functions can be realised by asymptotically best (optimal) with respect to the reliability circuits functioning with unreliability $P(S)\sim\gamma$ as $\gamma\to0$, where $\gamma$ is the probability of the faulty state of an element.
Received: 26.12.2005 Revised: 27.04.2007
Citation:
M. A. Alekhina, “On reliability of circuits over the bases $\{\sim,\&,\oplus\}$, $\{\sim,\&,0\}$, $\{\oplus,\&,1\}$, $\{\oplus,\vee,1\}$ in the case of faults of type 0 at the outputs of elements”, Diskr. Mat., 21:2 (2009), 102–111; Discrete Math. Appl., 19:1 (2009), 37–46
Linking options:
https://www.mathnet.ru/eng/dm1050https://doi.org/10.4213/dm1050 https://www.mathnet.ru/eng/dm/v21/i2/p102
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Abstract page: | 347 | Full-text PDF : | 209 | References: | 57 | First page: | 8 |
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