Methods for calculating zero-level instability of electronic circuits under variations in parameters and external disturbances

An important stage in the design of electronic circuits of various classes and purposes is the calculation of the zero-level instability of a developed device under the influence exerted on the parameters of its components by external disturbances (variations in temperature, humidity, pressure, radiation, etc.), as well as by technological variations in these parameters in the course of serial manufacturing. A mathematical description of the problem of calculating the zero-level instability of an electronic circuit is constructed for the common case when the coordinates of operating points of all circuit components are known and the task is to find their deviations under variations in the parameters of circuit components caused by external disturbances, as well as under technological variations in these parameters in the course of manufacturing. An advantage of the proposed technique is that it avoids multiple calculations of a nonlinear circuit and its sensitivity to parameter variations, instead dealing with a mathematical description of the linearized circuit, which is used to determine the deviations of variables from their initial stationary values. As a result, the amount of computational operations is dramatically reduced and the computation time is reduced as well, which is especially important for solving optimization problems in electronic circuit design.