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Doklady Akademii Nauk SSSR, 1985, Volume 282, Number 3, Pages 608–611 (Mi dan47026)  
CRYSTALLOGRAPHY

Possfoilities of X-ray topography investigations of the strain fields around microdefects

V. L. Indenbom, V. M. Kaganer

Institute of Cristallography of the USSR Academy of Sciences, Moscow
Full-text PDF (753 kB)
Presented: B. K. Vaĭnshteĭn
Received: 29.05.1984
Document Type: Article
UDC: 548.732
Language: Russian
Citation: V. L. Indenbom, V. M. Kaganer, “Possfoilities of X-ray topography investigations of the strain fields around microdefects”, Dokl. Akad. Nauk SSSR, 282:3 (1985), 608–611
Citation in format AMSBIB
\Bibitem{IndKag85}
\by V.~L.~Indenbom, V.~M.~Kaganer
\paper Possfoilities of X-ray topography investigations of the strain fields around microdefects
\jour Dokl. Akad. Nauk SSSR
\yr 1985
\vol 282
\issue 3
\pages 608--611
\mathnet{http://mi.mathnet.ru/dan47026}
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