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Doklady Akademii Nauk SSSR, 1983, Volume 271, Number 5, Pages 1130–1133 (Mi dan46235)  
CRYSTALLOGRAPHY

Determination of the coefficients of the crystal density single-electron matrix representation from X-ray diffraction data

Yu. V. Alexandrov, V. G. Tsirelson, R. P. Ozerov

Moscow Chemical Technology Institute
Full-text PDF (596 kB)
Presented: N. V. Belov
Received: 28.12.1981
Document Type: Article
UDC: 539.261+541:530.145.6
Language: Russian
Citation: Yu. V. Alexandrov, V. G. Tsirelson, R. P. Ozerov, “Determination of the coefficients of the crystal density single-electron matrix representation from X-ray diffraction data”, Dokl. Akad. Nauk SSSR, 271:5 (1983), 1130–1133
Citation in format AMSBIB
\Bibitem{AleTsiOze83}
\by Yu.~V.~Alexandrov, V.~G.~Tsirelson, R.~P.~Ozerov
\paper Determination of the coefficients of the crystal density single-electron matrix representation from X-ray diffraction data
\jour Dokl. Akad. Nauk SSSR
\yr 1983
\vol 271
\issue 5
\pages 1130--1133
\mathnet{http://mi.mathnet.ru/dan46235}
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