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CRYSTALLOGRAPHY
Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer
A. M. Gaskov, A. A. Gol'denveizer, I. A. Sokolov, V. P. Zlomanov, A. V. Novoselova
Received: 23.11.1982
Citation:
A. M. Gaskov, A. A. Gol'denveizer, I. A. Sokolov, V. P. Zlomanov, A. V. Novoselova, “Auger-electronic microanalysis of oxidized lead sulfide polycrystalline layer”, Dokl. Akad. Nauk SSSR, 269:3 (1983), 607–609
Linking options:
https://www.mathnet.ru/eng/dan46021 https://www.mathnet.ru/eng/dan/v269/i3/p607
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