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Doklady Akademii Nauk SSSR, 1982, Volume 265, Number 2, Pages 339–343 (Mi dan45444)  
CRYSTALLOGRAPHY

Diffraction of X-rays by mixed-layered structures with random distribution of packing defects

B. A. Sakharov, A. S. Naumov, V. A. Drits

Geological Institute, USSR Academy of Sciences, Moscow
Full-text PDF (673 kB)
Presented: B. K. Vaĭnshteĭn
Received: 08.02.1982
Document Type: Article
UDC: 548.73:548.4
Language: Russian
Citation: B. A. Sakharov, A. S. Naumov, V. A. Drits, “Diffraction of X-rays by mixed-layered structures with random distribution of packing defects”, Dokl. Akad. Nauk SSSR, 265:2 (1982), 339–343
Citation in format AMSBIB
\Bibitem{SakNauDri82}
\by B.~A.~Sakharov, A.~S.~Naumov, V.~A.~Drits
\paper Diffraction of X-rays by mixed-layered structures with random distribution of packing defects
\jour Dokl. Akad. Nauk SSSR
\yr 1982
\vol 265
\issue 2
\pages 339--343
\mathnet{http://mi.mathnet.ru/dan45444}
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