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Doklady Akademii Nauk SSSR, 1964, Volume 156, Number 6, Pages 1339–1340 (Mi dan29763)  
CRYSTALLOGRAPHY

Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations

V. N. Rozhanskii, G. V. Berezhkova

Institute of Cristallography of the USSR Academy of Sciences, Moscow
Full-text PDF (631 kB)
Presented: A. V. Shubnikov
Received: 19.02.1964
Document Type: Article
Language: Russian
Citation: V. N. Rozhanskii, G. V. Berezhkova, “Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations”, Dokl. Akad. Nauk SSSR, 156:6 (1964), 1339–1340
Citation in format AMSBIB
\Bibitem{RozBer64}
\by V.~N.~Rozhanskii, G.~V.~Berezhkova
\paper Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
\jour Dokl. Akad. Nauk SSSR
\yr 1964
\vol 156
\issue 6
\pages 1339--1340
\mathnet{http://mi.mathnet.ru/dan29763}
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