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Computer Optics, 2015, Volume 39, Issue 2, Pages 152–157
DOI: https://doi.org/10.18287/0134-2452-2015-39-2-152-157
(Mi co69)
 

OPTO-IT

Simulation of characteristics of a nanophotonic electrooptical modulator on a silicon on insulator structure

N. V. Masalsky

Scientific Research Institute for System Analysis of the Russian Academy of Sciences
References:
Abstract: A promising approach to simulating characteristics of silicon nanophotonic modulators fabricated using a standard Silicon On Insulator (SOI) fabrication process is discussed. Optical characteristics of the waveguide structure are changed by means of the free-carrier dispersion effect. On the basis of numerical calculations, the device topological parameters are optimized for achievement of superior modulation characteristics.
Keywords: silicon photonic, waveguide optical structure, eloctrooptical modulator, Silicon On Insulator (SOI).
Received: 27.01.2015
Revised: 30.03.2015
Document Type: Article
Language: Russian
Citation: N. V. Masalsky, “Simulation of characteristics of a nanophotonic electrooptical modulator on a silicon on insulator structure”, Computer Optics, 39:2 (2015), 152–157
Citation in format AMSBIB
\Bibitem{Mas15}
\by N.~V.~Masalsky
\paper Simulation of characteristics of a nanophotonic electrooptical modulator on a silicon on insulator structure
\jour Computer Optics
\yr 2015
\vol 39
\issue 2
\pages 152--157
\mathnet{http://mi.mathnet.ru/co69}
\crossref{https://doi.org/10.18287/0134-2452-2015-39-2-152-157}
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