A method to improve the resolution of the diffraction spectrophotometer

In a number of situations, the resolution of modern spectrometers may be not high enough. This communication describes the use of an auxiliary interferometer together with a diffraction spectrometer, thus enabling its resolution and sensitivity to be enhanced during spectroscopy of adsorbed molecular layers. In this way, the industrial device is turned into a combined diffraction-interference monochromator. Numerical calculations and experiments show that the resolution of the combined diffraction spectrometer can be enhanced by an order of magnitude. In addition, the described device is a tunable multi-beam interferometer, allowing scanning through the spectrum. Scanning is done by turning the multi-beam interferometer. The article provides experimental data on adjusting the interferometer by tilting it with respect to incident radiation. Provision is made for the adjustment of the device by using a piezo plate. The increased sensitivity of the combined device allows it to be used as a spectrum analyzer of adsorbed substances. The design of the attachment provides an easy-to-install fitting for the input of the substance under test.