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This article is cited in 3 scientific papers (total in 3 papers)
OPTO-IT
Determination of organic contaminant concentration on the silica surface by lateral force microscopy
N. A. Ivlievab, V. A. Kolpakova, S. V. Krichevskiya a Samara National Research University, Samara, Russia
b Image Processing Systems Institute of the RAS - Branch of the FSRC "Crystallography and Photonics" RAS, Samara, Russia
Abstract:
We present a method for determining the concentration of organic contaminants on the silica surface by using lateral force maps and surface topology images obtained with scanning probe microscopy. In this study, we optimized the scanning frequency to increase the contrast of images and facilitate interpretation of the data obtained. We also proved experimentally that the sensitivity of the method reaches $10^{-11}$ g/cm$^2$.
Keywords:
concentration of organic contaminants, lateral force.
Received: 21.11.2016 Accepted: 09.12.2016
Citation:
N. A. Ivliev, V. A. Kolpakov, S. V. Krichevskiy, “Determination of organic contaminant concentration on the silica surface by lateral force microscopy”, Computer Optics, 40:6 (2016), 837–843
Linking options:
https://www.mathnet.ru/eng/co334 https://www.mathnet.ru/eng/co/v40/i6/p837
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