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Computational nanotechnology, 2022, Volume 9, Issue 1, Pages 125–131
DOI: https://doi.org/10.33693/2313-223X-2022-9-1-125-131
(Mi cn366)
 

This article is cited in 1 scientific paper (total in 1 paper)

DEVELOPMENT OF FUNCTIONAL NANOMATERIALS BASED ON NANOPARTICLES AND POLYMER NANOSTRUCTURES

Investigation of thin films MgAl$_{2}$O$_{4}$, deposited on the si substrates by vacuum thermal evaporation

A. Stanchika, V. F. Gremenoka, E. L. Trukhanovaa, V. V. Khoroshkob, S. Kh. Suleymanovc, V. G. Dyskinc, M. U. Djanklichc, N. A. Kulaginac, Sh. Y. Amirovc

a State Scientific and Production Association “Scientific-Practical Materials Research Centre of the National Academy of Sciences of Belarus”
b Belarusian State University of Informatics and Radioelectronics
c Institute of Materials Science of the SPA “Physics-Sun” of the Academy of Sciences of the Republic of Uzbekistan
Citations (1)
Abstract: The article presents data on the study of X-ray structural and microstructural characteristics of thin films of aluminum-magnesium spinel MgAl$_{2}$O$_{4}$ deposited on Si substrates by vacuum thermal evaporation. MgAl$_{2}$O$_{4}$ films have a polycrystalline rhombic structure. The values of the unit cell parameters of MgAl$_{2}$O$_{4}$ are calculated. Scanning electron and atomic force microscopy showed that MgAl$_{2}$O$_{4}$ films have a densely packed structure without cracks. Physical characteristics and good adhesion of MgAl$_{2}$O$_{4}$ thin films to silicon substrates indicate their possibility of using in devices of opto- and microelectronics.
Keywords: thin films, aluminum-magnesium spinel, X-ray structural analysis, microstructure, unit cell parameters, rhombic structure.
Received: 18.02.2022
Bibliographic databases:
Document Type: Article
UDC: 539.2
Language: Russian
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    Computational nanotechnology
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