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This article is cited in 1 scientific paper (total in 1 paper)
Physics
Reflection of microvawes from thin film of vanadium dioxide
D. A. Kuzmina, I. V. Bychkova, M. G. Vakhitovb, D. S. Klygachb a Chelyabinsk State University, Chelyabinsk, Russia
b South Ural State University (National Research University), Chelyabinsk, Russia
Abstract:
The reflection of a microwaves from a thin film of vanadium dioxide on a dielectric substrate in the vicinity of the semiconductor-metal phase transition is studied. The frequency dependences of the reflectance at various temperatures in the region of the phase transition are calculated. A dip is found in the frequency dependence of the reflection coefficient, which shifts to lower frequencies during the phase transition.
Keywords:
microwaves, vanadium dioxide, phase transition.
Received: 11.01.2022 Revised: 10.03.2022
Citation:
D. A. Kuzmin, I. V. Bychkov, M. G. Vakhitov, D. S. Klygach, “Reflection of microvawes from thin film of vanadium dioxide”, Chelyab. Fiz.-Mat. Zh., 7:1 (2022), 123–130
Linking options:
https://www.mathnet.ru/eng/chfmj275 https://www.mathnet.ru/eng/chfmj/v7/i1/p123
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