The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS

The application of the method of parallel-sequential built-in self-testing (PSBST) to microcircuits of the type $FPGA$ is considered. Suggestions for the transformation of the $FPGA$ to the control-suitable form are given and costs for this transformation are estimated. The comparison is made for the costs of the PSBST method with the known testing methods.