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Avtomatika i Telemekhanika, 2007, Issue 1, Pages 163–174
(Mi at930)
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This article is cited in 5 scientific papers (total in 5 papers)
Technical Diagnostics
The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS
G. P. Aksenova, V. F. Khalchev Trapeznikov Institute of Control Sciences, Russian Academy of Sciences, Moscow, Russia
Abstract:
The application of the method of parallel-sequential built-in self-testing (PSBST) to microcircuits of the type $FPGA$ is considered. Suggestions for the transformation of the $FPGA$ to the control-suitable form are given and costs for this transformation are estimated. The comparison is made for the costs of the PSBST method with the known testing methods.
Citation:
G. P. Aksenova, V. F. Khalchev, “The method of parallel-sequential built-in self-testing in integrated circuits of the type SFPGAS”, Avtomat. i Telemekh., 2007, no. 1, 163–174; Autom. Remote Control, 68:1 (2007), 149–159
Linking options:
https://www.mathnet.ru/eng/at930 https://www.mathnet.ru/eng/at/y2007/i1/p163
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