Construction of self-testing in-built monitoring circuits for combinational devices

The problem of self-testing in-built monitoring circuit construction is investigated. It is shown that any single faults of the combinational device can be detected by the in-built monitoring circuit while this device is functioning. A structural method to obtain self-testing in-built module 2 monitoring circuit is proposed. The method is based on analysis of the device structure generalized graph and the use of Boolean derivatives.