Analysis and elimination of critical signal races in design of test sequences

The paper describes computer-oriented methods for analysis and elimination of races through the use of binary coverings. The analysis technique is cubic modelling of test sets. Critical races in the sets are eliminated by the method of simple cubes. The signal races in transfer from one set to another resulting from the staticrisk of a fault in the combinational part of the circuit are eliminated by design of intermediate sets by the method of bounds on intersection.