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Avtomatika i Telemekhanika, 2008, Issue 12, Pages 149–162
(Mi at770)
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Technical Diagnostics
Method for segregation of suspected logical malfunctions in combinatorial discrete devices
R. A. Babkin, A. V. Lobanov Federal State Unitary Enterprise "Submikron", Moscow, Russia
Abstract:
Consideration was given to the direct problem of technical diagnosis which lies in determining the technical state of a combinatorial discrete device from the results of testing. The graph and analytical models of behavior of the combinatorial discrete device allowing for the technical state of its elements were presented. A method of segregation of the suspected logical malfunctions under which observable behavior of the combinatorial discrete device is possible was proposed.
Citation:
R. A. Babkin, A. V. Lobanov, “Method for segregation of suspected logical malfunctions in combinatorial discrete devices”, Avtomat. i Telemekh., 2008, no. 12, 149–162; Autom. Remote Control, 69:12 (2008), 2129–2141
Linking options:
https://www.mathnet.ru/eng/at770 https://www.mathnet.ru/eng/at/y2008/i12/p149
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