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Avtomatika i Telemekhanika, 1977, Issue 8, Pages 168–176 (Mi at7428)  
Technical Diagnostics

Analysis of diagnostical tests for combinational digital circuits by the method of backtracking the faults

R. R. Ubar

Tallin
Full-text PDF (1581 kB)
Abstract: A new approach is suggested to simulation of diagnostical tests in combinational digital circuits that combined the parallel way of logical compilation and deductive analysis of faulty situations in the logic simulated.

Received: 29.08.1976
Bibliographic databases:
Document Type: Article
UDC: 681.326.7
Language: Russian
Citation: R. R. Ubar, “Analysis of diagnostical tests for combinational digital circuits by the method of backtracking the faults”, Avtomat. i Telemekh., 1977, no. 8, 168–176; Autom. Remote Control, 38:8 (1978), 1254–1260
Citation in format AMSBIB
\Bibitem{Uba77}
\by R.~R.~Ubar
\paper Analysis of diagnostical tests for combinational digital circuits by the method of backtracking the faults
\jour Avtomat. i Telemekh.
\yr 1977
\issue 8
\pages 168--176
\mathnet{http://mi.mathnet.ru/at7428}
\zmath{https://zbmath.org/?q=an:0417.94025}
\transl
\jour Autom. Remote Control
\yr 1978
\vol 38
\issue 8
\pages 1254--1260
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  • https://www.mathnet.ru/eng/at/y1977/i8/p168
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