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Avtomatika i Telemekhanika, 2008, Issue 8, Pages 139–152
(Mi at711)
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This article is cited in 1 scientific paper (total in 1 paper)
Technical Diagnostics
Testing diagnostics of modern microprocessors with the use of functional models
V. V. Belkin Far Eastern State Academy of Economics and Management, Vladivostok, Russia
Abstract:
A new approach for developing functional diagnostic tests of processors with parallelism of the level of computer code is represented. The approach is based on functional decomposition of the processor architecture and use of functional models. The approach is applied to developing the technique for testing mechanisms of storage and transmission of conveyor process data. Models and algorithms for generation of tests of these mechanisms are developed. The performance of diagnostic tests is approved on the model.
Citation:
V. V. Belkin, “Testing diagnostics of modern microprocessors with the use of functional models”, Avtomat. i Telemekh., 2008, no. 8, 139–152; Autom. Remote Control, 69:8 (2008), 1398–1410
Linking options:
https://www.mathnet.ru/eng/at711 https://www.mathnet.ru/eng/at/y2008/i8/p139
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Statistics & downloads: |
Abstract page: | 261 | Full-text PDF : | 197 | References: | 37 | First page: | 2 |
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