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Avtomatika i Telemekhanika, 1985, Issue 1, Pages 122–126 (Mi at6872)  
Technical Diagnostics

On Circuits for Functional and Test Diagnosing of Sampled Data Units

D. V. Speranskii

Donetsk
Full-text PDF (942 kB)
Abstract: A technique is proposed to design of a built- in circuit to be connected to a specified combinational or sequential sampled data units, SDU. The technique, which relies en the distributed redundancy principle, is shown to lead in some cases to a more economical system design, than that provided by the autonomous redundancy principle.

Received: 16.01.1984
Document Type: Article
UDC: 62.504.681.326.7
Language: Russian
Citation: D. V. Speranskii, “On Circuits for Functional and Test Diagnosing of Sampled Data Units”, Avtomat. i Telemekh., 1985, no. 1, 122–126
Citation in format AMSBIB
\Bibitem{Spe85}
\by D.~V.~Speranskii
\paper On Circuits for Functional and Test Diagnosing of Sampled Data Units
\jour Avtomat. i Telemekh.
\yr 1985
\issue 1
\pages 122--126
\mathnet{http://mi.mathnet.ru/at6872}
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  • https://www.mathnet.ru/eng/at/y1985/i1/p122
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