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Avtomatika i Telemekhanika, 1989, Issue 12, Pages 118–129 (Mi at6495)  
Technical Diagnostics

Design of functional tests for single-crystal microprocessors

O. V. Goncharovskiy, E. L. Kon

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Full-text PDF (1713 kB)
Abstract: Diagnostic functional models are defined for single-crystal general- and specialpurpose microprocessors with register transfer in the shape of logical circuits. A technique is proposed for design of functional tests for the stages of instruction access and execution.

Received: 21.04.1988
Bibliographic databases:
Document Type: Article
UDC: 681. 326.32:519.718.7
Language: Russian
Citation: O. V. Goncharovskiy, E. L. Kon, “Design of functional tests for single-crystal microprocessors”, Avtomat. i Telemekh., 1989, no. 12, 118–129; Autom. Remote Control, 50:12 (1989), 1710–1718
Citation in format AMSBIB
\Bibitem{GonKon89}
\by O.~V.~Goncharovskiy, E.~L.~Kon
\paper Design of functional tests for single-crystal microprocessors
\jour Avtomat. i Telemekh.
\yr 1989
\issue 12
\pages 118--129
\mathnet{http://mi.mathnet.ru/at6495}
\zmath{https://zbmath.org/?q=an:0800.94292}
\transl
\jour Autom. Remote Control
\yr 1989
\vol 50
\issue 12
\pages 1710--1718
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