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Avtomatika i Telemekhanika, 1981, Issue 11, Pages 139–146 (Mi at6052)  
Technical Diagnostics

Properties of multiple faults in contact logical circuits

T. G. Melkadze, V. V. Sapozhnikov, Vl. V. Sapozhnikov

Leningrad
Full-text PDF (1540 kB)
Abstract: Properties of multiple faults in parallel-and-sequential contact circuits are discussed. A method is proposed for design of a checking list of faults whose detection insures detection of any multiple fault in irradundand circuits.

Received: 03.09.1980
Bibliographic databases:
Document Type: Article
UDC: 621.3.019.3:681.325.65
Language: Russian
Citation: T. G. Melkadze, V. V. Sapozhnikov, Vl. V. Sapozhnikov, “Properties of multiple faults in contact logical circuits”, Avtomat. i Telemekh., 1981, no. 11, 139–146; Autom. Remote Control, 42:11 (1981), 1545–1551
Citation in format AMSBIB
\Bibitem{MelSapSap81}
\by T.~G.~Melkadze, V.~V.~Sapozhnikov, Vl.~V.~Sapozhnikov
\paper Properties of multiple faults in contact logical circuits
\jour Avtomat. i Telemekh.
\yr 1981
\issue 11
\pages 139--146
\mathnet{http://mi.mathnet.ru/at6052}
\zmath{https://zbmath.org/?q=an:0484.94037}
\transl
\jour Autom. Remote Control
\yr 1981
\vol 42
\issue 11
\pages 1545--1551
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  • https://www.mathnet.ru/eng/at/y1981/i11/p139
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