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Avtomatika i Telemekhanika, 1990, Issue 9, Pages 118–129
(Mi at5937)
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Technical Diagnostics
Logical Dynamic Testing of Synchronous CMOS VLSI
V. M. Krivoshapko, D. O. Levitsky Moscow Electronic Engineering Institute
Received: 14.04.1989
Citation:
V. M. Krivoshapko, D. O. Levitsky, “Logical Dynamic Testing of Synchronous CMOS VLSI”, Avtomat. i Telemekh., 1990, no. 9, 118–129; Autom. Remote Control, 51:9 (1990), 1258–1266
Linking options:
https://www.mathnet.ru/eng/at5937 https://www.mathnet.ru/eng/at/y1990/i9/p118
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