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Avtomatika i Telemekhanika, 1981, Issue 4, Pages 165–169
(Mi at5774)
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Technical Diagnostics
Diagnozing the technical state of discrete devices with memory. II
V. M. Neguritsa Donetsk
Abstract:
A method which makes use of an experiment decodidng algorithm is proposed whereby test sequences are designed for sampled data units with memory.
Received: 13.03.1980
Citation:
V. M. Neguritsa, “Diagnozing the technical state of discrete devices with memory. II”, Avtomat. i Telemekh., 1981, no. 4, 165–169; Autom. Remote Control, 42:4 (1981), 543–546
Linking options:
https://www.mathnet.ru/eng/at5774 https://www.mathnet.ru/eng/at/y1981/i4/p165
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Statistics & downloads: |
Abstract page: | 86 | Full-text PDF : | 33 | First page: | 2 |
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