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Avtomatika i Telemekhanika, 1991, Issue 7, Pages 167–181 (Mi at4234)  
Reliability

Parametric Bayesian Markov model of reliability growth by testing and development

V. P. Savchuk, V. B. Chernyavskii

Dnepropetrovsk State University
Full-text PDF (1887 kB)

Received: 06.09.1990
Bibliographic databases:
Document Type: Article
UDC: 519.718:519.213
Language: Russian
Citation: V. P. Savchuk, V. B. Chernyavskii, “Parametric Bayesian Markov model of reliability growth by testing and development”, Avtomat. i Telemekh., 1991, no. 7, 167–181; Autom. Remote Control, 52:7 (1991), 1015–1026
Citation in format AMSBIB
\Bibitem{SavChe91}
\by V.~P.~Savchuk, V.~B.~Chernyavskii
\paper Parametric Bayesian Markov model of reliability growth by testing and development
\jour Avtomat. i Telemekh.
\yr 1991
\issue 7
\pages 167--181
\mathnet{http://mi.mathnet.ru/at4234}
\zmath{https://zbmath.org/?q=an:0742.60088}
\transl
\jour Autom. Remote Control
\yr 1991
\vol 52
\issue 7
\pages 1015--1026
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  • https://www.mathnet.ru/eng/at/y1991/i7/p167
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