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Avtomatika i Telemekhanika, 1993, Issue 6, Pages 169–179 (Mi at2976)  
Reliability

RAM of High Reliability Properties. II

A. S. Bernstein, Yu. L. Tomfield, I. V. Shagaev

Institute of Control Sciences, Russian Academy of Sciences
Full-text PDF (1651 kB)

Received: 20.05.1992
Document Type: Article
UDC: 681.327.2
Language: Russian
Citation: A. S. Bernstein, Yu. L. Tomfield, I. V. Shagaev, “RAM of High Reliability Properties. II”, Avtomat. i Telemekh., 1993, no. 6, 169–179
Citation in format AMSBIB
\Bibitem{BerTomSha93}
\by A.~S.~Bernstein, Yu.~L.~Tomfield, I.~V.~Shagaev
\paper RAM of High Reliability Properties.~II
\jour Avtomat. i Telemekh.
\yr 1993
\issue 6
\pages 169--179
\mathnet{http://mi.mathnet.ru/at2976}
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  • https://www.mathnet.ru/eng/at/y1993/i6/p169
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