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Avtomatika i Telemekhanika, 2000, Issue 5, Pages 141–156
(Mi at290)
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This article is cited in 1 scientific paper (total in 1 paper)
Technical Diagnostics
A test algorithm for multiple-valued logic combinational circuits
V. Levashenkoa, K. Moragab, G. Kholovinskic, S. N. Yanushkevichc, V. P. Shmerkod a Belarusian State Economic University
b Universität Dortmund, Institut für Mathematik
c University of Szczecin
d Belarussian State University of Computer Science and Radioelectronic Engineering
Citation:
V. Levashenko, K. Moraga, G. Kholovinski, S. N. Yanushkevich, V. P. Shmerko, “A test algorithm for multiple-valued logic combinational circuits”, Avtomat. i Telemekh., 2000, no. 5, 141–156; Autom. Remote Control, 61:5 (2000), 844–857
Linking options:
https://www.mathnet.ru/eng/at290 https://www.mathnet.ru/eng/at/y2000/i5/p141
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Statistics & downloads: |
Abstract page: | 223 | Full-text PDF : | 254 | First page: | 2 |
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