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Avtomatika i Telemekhanika, 1998, Issue 7, Pages 157–167 (Mi at2765)  
Technical Diagnostics

Built-in self-test scanners for very large-scale integration: a new design approach

I. A. Murashko, A. M. Shmidman, V. N. Yarmolik

Belarussian State University of Computer Science and Radioelectronic Engineering
Full-text PDF (1731 kB)

Received: 25.10.1996
Bibliographic databases:
Document Type: Article
UDC: 681.326.7
Language: Russian
Citation: I. A. Murashko, A. M. Shmidman, V. N. Yarmolik, “Built-in self-test scanners for very large-scale integration: a new design approach”, Avtomat. i Telemekh., 1998, no. 7, 157–167; Autom. Remote Control, 59:7 (1998), 1032–1039
Citation in format AMSBIB
\Bibitem{MurShmYar98}
\by I.~A.~Murashko, A.~M.~Shmidman, V.~N.~Yarmolik
\paper Built-in self-test scanners for very large-scale integration: a~new design approach
\jour Avtomat. i Telemekh.
\yr 1998
\issue 7
\pages 157--167
\mathnet{http://mi.mathnet.ru/at2765}
\zmath{https://zbmath.org/?q=an:1079.68510}
\transl
\jour Autom. Remote Control
\yr 1998
\vol 59
\issue 7
\pages 1032--1039
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  • https://www.mathnet.ru/eng/at/y1998/i7/p157
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