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Avtomatika i Telemekhanika, 1997, Issue 12, Pages 193–200 (Mi at2754)  
This article is cited in 2 scientific papers (total in 2 papers)

Technical Diagnostics

Fault Detection in Self-Test Combination Circuits Using the Properties of Self-Dual Functions

M. Hessela, V. I. Moshanina, V. V. Sapozhnikovb, Vl. V. Sapozhnokovb

a University of Potsdam, Germany
b Petersburg State Transport University
Full-text PDF (1239 kB) Citations (2)

Received: 09.04.1996
Document Type: Article
UDC: 519.714.2
Language: Russian
Citation: M. Hessel, V. I. Moshanin, V. V. Sapozhnikov, Vl. V. Sapozhnokov, “Fault Detection in Self-Test Combination Circuits Using the Properties of Self-Dual Functions”, Avtomat. i Telemekh., 1997, no. 12, 193–200
Citation in format AMSBIB
\Bibitem{GesMosSap97}
\by M.~Hessel, V.~I.~Moshanin, V.~V.~Sapozhnikov, Vl.~V.~Sapozhnokov
\paper Fault Detection in Self-Test Combination Circuits Using the Properties of Self-Dual Functions
\jour Avtomat. i Telemekh.
\yr 1997
\issue 12
\pages 193--200
\mathnet{http://mi.mathnet.ru/at2754}
Linking options:
  • https://www.mathnet.ru/eng/at2754
  • https://www.mathnet.ru/eng/at/y1997/i12/p193
    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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