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Avtomatika i Telemekhanika, 1997, Issue 12, Pages 193–200
(Mi at2754)
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This article is cited in 2 scientific papers (total in 2 papers)
Technical Diagnostics
Fault Detection in Self-Test Combination Circuits Using the Properties of Self-Dual Functions
M. Hessela, V. I. Moshanina, V. V. Sapozhnikovb, Vl. V. Sapozhnokovb a University of Potsdam, Germany
b Petersburg State Transport University
Received: 09.04.1996
Citation:
M. Hessel, V. I. Moshanin, V. V. Sapozhnikov, Vl. V. Sapozhnokov, “Fault Detection in Self-Test Combination Circuits Using the Properties of Self-Dual Functions”, Avtomat. i Telemekh., 1997, no. 12, 193–200
Linking options:
https://www.mathnet.ru/eng/at2754 https://www.mathnet.ru/eng/at/y1997/i12/p193
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Abstract page: | 198 | Full-text PDF : | 111 | First page: | 2 |
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