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Avtomatika i Telemekhanika, 2000, Issue 2, Pages 151–163 (Mi at241)  
Technical Diagnostics

Self-testing combinational circuits: their design through the use of the properties of self-dual functions

M. Gessela, A. A. Morozova, V. V. Sapozhnikovb, Vl. V. Sapozhnokovb

a University of Potsdam
b Petersburg State Transport University
Full-text PDF (232 kB)
Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 24.03.1998
Bibliographic databases:
Document Type: Article
UDC: 519.714.2
Language: Russian
Citation: M. Gessel, A. A. Morozov, V. V. Sapozhnikov, Vl. V. Sapozhnokov, “Self-testing combinational circuits: their design through the use of the properties of self-dual functions”, Avtomat. i Telemekh., 2000, no. 2, 151–163; Autom. Remote Control, 61:2 (2000), 318–329
Citation in format AMSBIB
\Bibitem{GoeMorSap00}
\by M.~Gessel, A.~A.~Morozov, V.~V.~Sapozhnikov, Vl.~V.~Sapozhnokov
\paper Self-testing combinational circuits: their design through the use of the properties of self-dual functions
\jour Avtomat. i Telemekh.
\yr 2000
\issue 2
\pages 151--163
\mathnet{http://mi.mathnet.ru/at241}
\zmath{https://zbmath.org/?q=an:1107.94410}
\transl
\jour Autom. Remote Control
\yr 2000
\vol 61
\issue 2
\pages 318--329
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  • https://www.mathnet.ru/eng/at/y2000/i2/p151
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