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Avtomatika i Telemekhanika, 2001, Issue 4, Pages 148–159 (Mi at1771)  
This article is cited in 3 scientific papers (total in 3 papers)

Technical Diagnostics

Self-Dual Self-Testing Multicycle Circuits: Their Properties

M. Gessel'a, A. V. Dmitrievb, V. V. Sapozhnikovb, Vl. V. Sapozhnokovb

a University of Potsdam, Germany
b Petersburg State Transport University
Full-text PDF (207 kB) Citations (3)
Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 16.05.2000
English version:
Automation and Remote Control, 2001, Volume 62, Issue 4, Pages 642–652
DOI: https://doi.org/10.1023/A:1010245914985
Bibliographic databases:
Document Type: Article
UDC: 519.714.2
Language: Russian
Citation: M. Gessel', A. V. Dmitriev, V. V. Sapozhnikov, Vl. V. Sapozhnokov, “Self-Dual Self-Testing Multicycle Circuits: Their Properties”, Avtomat. i Telemekh., 2001, no. 4, 148–159; Autom. Remote Control, 62:4 (2001), 642–652
Citation in format AMSBIB
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\by M.~Gessel', A.~V.~Dmitriev, V.~V.~Sapozhnikov, Vl.~V.~Sapozhnokov
\paper Self-Dual Self-Testing Multicycle Circuits: Their Properties
\jour Avtomat. i Telemekh.
\yr 2001
\issue 4
\pages 148--159
\mathnet{http://mi.mathnet.ru/at1771}
\zmath{https://zbmath.org/?q=an:1074.94525}
\transl
\jour Autom. Remote Control
\yr 2001
\vol 62
\issue 4
\pages 642--652
\crossref{https://doi.org/10.1023/A:1010245914985}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=000169315300015}
\scopus{https://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-84904243387}
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  • https://www.mathnet.ru/eng/at1771
  • https://www.mathnet.ru/eng/at/y2001/i4/p148
    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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