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Avtomatika i Telemekhanika, 2004, Issue 11, Pages 174–189
(Mi at1669)
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This article is cited in 1 scientific paper (total in 1 paper)
Technical Diagnostics
Functional tests for RISC-microprocessors
S. G. Sharshunov Far-Eastern State Technical University
Abstract:
The well-known models and concepts of functional testing of microprocessors are described. The properties of the RISC-architecture that aid in applying effective approaches to hardware testing are stated. Functional decomposition is used to develop a sequence of actions implemented in designing tests. Special attention is paid to testing of control units. The RISC-architecture has shown to be helpful in designing effective algorithms for testing at the architectural level. The designed procedures detect most of the defects in control circuits indirectly through data processing and storing devices without the use of control units.
Citation:
S. G. Sharshunov, “Functional tests for RISC-microprocessors”, Avtomat. i Telemekh., 2004, no. 11, 174–189; Autom. Remote Control, 65:11 (2004), 1847–1859
Linking options:
https://www.mathnet.ru/eng/at1669 https://www.mathnet.ru/eng/at/y2004/i11/p174
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Statistics & downloads: |
Abstract page: | 154 | Full-text PDF : | 68 | References: | 42 | First page: | 2 |
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