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Avtomatika i Telemekhanika, 2004, Issue 8, Pages 156–173 (Mi at1622)  
Automated control systems

Optimization of parallel-series self-testing for discrete devices

G. P. Aksenova

Institute of Control Sciences, Russian Academy of Sciences
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Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 30.03.2004
English version:
Automation and Remote Control, 2004, Volume 65, Issue 8, Pages 1312–1327
DOI: https://doi.org/10.1023/B:AURC.0000038732.75638.3d
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: G. P. Aksenova, “Optimization of parallel-series self-testing for discrete devices”, Avtomat. i Telemekh., 2004, no. 8, 156–173; Autom. Remote Control, 65:8 (2004), 1312–1327
Citation in format AMSBIB
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