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Avtomatika i Telemekhanika, 2004, Issue 8, Pages 156–173
(Mi at1622)
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Automated control systems
Optimization of parallel-series self-testing for discrete devices
G. P. Aksenova Institute of Control Sciences, Russian Academy of Sciences
Citation:
G. P. Aksenova, “Optimization of parallel-series self-testing for discrete devices”, Avtomat. i Telemekh., 2004, no. 8, 156–173; Autom. Remote Control, 65:8 (2004), 1312–1327
Linking options:
https://www.mathnet.ru/eng/at1622 https://www.mathnet.ru/eng/at/y2004/i8/p156
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