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Avtomatika i Telemekhanika, 2015, Issue 4, Pages 149–157
(Mi at14216)
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Safety, Viability, Reliability, Technical Diagnostics
Reliability models for specialized computational devices with different fault types and temporal relations
V. O. Chukanov, I. M. Yadykin National Research Nuclear University MEPhI, Moscow, Russia
Abstract:
We study the problem of analyzing reliability characteristics of specialized computational devices with combined reservation taking into account fault types and temporal relations. We introduce a reliability criterion as the probability of functionally faultless operation. We propose new reliability models that take into account the distribution function of the time when the fault appears, the time when it is detected and so on. We find precision parameters for modeling results.
Citation:
V. O. Chukanov, I. M. Yadykin, “Reliability models for specialized computational devices with different fault types and temporal relations”, Avtomat. i Telemekh., 2015, no. 4, 149–157; Autom. Remote Control, 76:4 (2015), 668–674
Linking options:
https://www.mathnet.ru/eng/at14216 https://www.mathnet.ru/eng/at/y2015/i4/p149
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Statistics & downloads: |
Abstract page: | 178 | Full-text PDF : | 57 | References: | 45 | First page: | 12 |
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