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Avtomatika i Telemekhanika, 2015, Issue 4, Pages 149–157 (Mi at14216)  
Safety, Viability, Reliability, Technical Diagnostics

Reliability models for specialized computational devices with different fault types and temporal relations

V. O. Chukanov, I. M. Yadykin

National Research Nuclear University MEPhI, Moscow, Russia
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Abstract: We study the problem of analyzing reliability characteristics of specialized computational devices with combined reservation taking into account fault types and temporal relations. We introduce a reliability criterion as the probability of functionally faultless operation. We propose new reliability models that take into account the distribution function of the time when the fault appears, the time when it is detected and so on. We find precision parameters for modeling results.
Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 20.12.2013
English version:
Automation and Remote Control, 2015, Volume 76, Issue 4, Pages 668–674
DOI: https://doi.org/10.1134/S0005117915040116
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. O. Chukanov, I. M. Yadykin, “Reliability models for specialized computational devices with different fault types and temporal relations”, Avtomat. i Telemekh., 2015, no. 4, 149–157; Autom. Remote Control, 76:4 (2015), 668–674
Citation in format AMSBIB
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