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Avtomatika i Telemekhanika, 2015, Issue 4, Pages 135–148 (Mi at14215)  
This article is cited in 2 scientific papers (total in 2 papers)

Safety, Viability, Reliability, Technical Diagnostics

Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits

A. Yu. Matrosova, V. B. Lipskii

Tomsk State University, Tomsk, Russia
Full-text PDF (310 kB) Citations (2)
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Abstract: A single path delay fault of a circuit is reduced to a fault in the literal in the equivalent normal form (ENF) that corresponds to the path that acts during the path delay. Based on the analysis of the ENF circuit, we have found properties of pairs of robust and nonrobust test vectors. We show possibilities to reduce the length of the test for path delay faults.
Presented by the member of Editorial Board: P. Yu. Chebotarev

Received: 21.03.2011
English version:
Automation and Remote Control, 2015, Volume 76, Issue 4, Pages 658–667
DOI: https://doi.org/10.1134/S0005117915040104
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. Yu. Matrosova, V. B. Lipskii, “Properties of pairs of test vectors detecting path delay faults in high performance VLSI logical circuits”, Avtomat. i Telemekh., 2015, no. 4, 135–148; Autom. Remote Control, 76:4 (2015), 658–667
Citation in format AMSBIB
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  • https://www.mathnet.ru/eng/at/y2015/i4/p135
    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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    Full-text PDF :57
    References:55
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