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Avtomatika i Telemekhanika, 1999, Issue 7, Pages 142–153 (Mi at124)  

Technical Diagnostics

Iddq testing-based diagnosis of faults in CMOS-circuits

Yu. V. Bykova, A. A. Ivanyuka, A. I. Yanushkevich, V. N. Yarmolika

a Belarussian State University of Computer Science and Radioelectronic Engineering
Presented by the member of Editorial Board: P. P. Parkhomenko

Received: 03.06.1997
Bibliographic databases:
Document Type: Article
UDC: 681.3
Language: Russian
Citation: Yu. V. Bykov, A. A. Ivanyuk, A. I. Yanushkevich, V. N. Yarmolik, “Iddq testing-based diagnosis of faults in CMOS-circuits”, Avtomat. i Telemekh., 1999, no. 7, 142–153; Autom. Remote Control, 60:7 (1999), 1021–1020
Citation in format AMSBIB
\Bibitem{BykIvaYan99}
\by Yu.~V.~Bykov, A.~A.~Ivanyuk, A.~I.~Yanushkevich, V.~N.~Yarmolik
\paper Iddq testing-based diagnosis of faults in CMOS-circuits
\jour Avtomat. i Telemekh.
\yr 1999
\issue 7
\pages 142--153
\mathnet{http://mi.mathnet.ru/at124}
\transl
\jour Autom. Remote Control
\yr 1999
\vol 60
\issue 7
\pages 1021--1020
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=000084373400005}
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  • https://www.mathnet.ru/eng/at124
  • https://www.mathnet.ru/eng/at/y1999/i7/p142
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    Avtomatika i Telemekhanika
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