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Avtomatika i Telemekhanika, 1999, Issue 7, Pages 142–153
(Mi at124)
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Technical Diagnostics
Iddq testing-based diagnosis of faults in CMOS-circuits
Yu. V. Bykova, A. A. Ivanyuka, A. I. Yanushkevich, V. N. Yarmolika a Belarussian State University of Computer Science and Radioelectronic Engineering
Citation:
Yu. V. Bykov, A. A. Ivanyuk, A. I. Yanushkevich, V. N. Yarmolik, “Iddq testing-based diagnosis of faults in CMOS-circuits”, Avtomat. i Telemekh., 1999, no. 7, 142–153; Autom. Remote Control, 60:7 (1999), 1021–1020
Linking options:
https://www.mathnet.ru/eng/at124 https://www.mathnet.ru/eng/at/y1999/i7/p142
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Statistics & downloads: |
Abstract page: | 214 | Full-text PDF : | 120 | First page: | 2 |
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